The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for ...

Microscope can magnify objects greater than 1,000,000 times and will chiefly aid in research and development of nanomaterials, thin films SAN ANTONIO--(BUSINESS WIRE)--Southwest Research Institute is ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, ...

In recent decades, the Field Emission Scanning Electron Microscope (FE-SEM) has become a cornerstone of analytical science, offering professionals across various scientific and engineering disciplines ...

HILLSBORO, Ore. — FEI Company said today (March 11, 2003) that it has an environmental scanning electron microscope based on field emission gun (FEG) technology. With it's ability to form images ...

Tsukuba, Japan—Research and development of organic electronics such as organic solar cells and organic light-emitting diodes is rapidly advancing. The "shape" of the electron orbitals of organic ...

(Nanowerk News) The National Institute for Materials Science (NIMS) and JEOL, Ltd. have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an ...

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Using light to measure ever-smaller objects has been central to progress in many scientific disciplines for centuries. As far back as 1873, German physicist Ernst Abbe proved that light diffraction ...

The Hitachi SU70 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) is a top level research grade SEM with excellent performance both at low kV ...