In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...
Identifying and dealing with outliers is an important part of data analysis. A new visualization, the O3 plot, is introduced to aid in the display and understanding of patterns of multivariate ...
The mission of Technometrics is to contribute to the development and use of statistical methods in the physical, chemical, and engineering sciences. Its content features papers that describe new ...
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